Stochastic models of partial discharge activity in solid and liquid dielectrics Научная публикация
Журнал |
IET Science, Measurement and Technology
ISSN: 1751-8822 |
||||
---|---|---|---|---|---|
Вых. Данные | Год: 2007, Том: 1, Номер: 6, Страницы: 303-311 Страниц : 9 DOI: 10.1049/iet-smt:20060104 | ||||
Авторы |
|
||||
Организации |
|
Реферат:
A new model that can reproduce main stochastic features of partial discharge (PD)
activity at AC and DC voltages was proposed. The type of PD activity because of microdischarges
in small cavities present in dielectric materials was considered. Three different criteria were used to
simulate an initiation of partial discharge inside voids. The simplest criterion of threshold type was
used also to describe a decay of plasma in voids and subsequent decrease in conductivity to zero.
After AC voltage was applied to solid dielectric, the narrow peaks of current in external circuit
were observed in our simulations. Every peak corresponds to a moment of PD in a void. The behaviour of cavities in dielectric liquid under DC voltage was also simulated. In this case, PD activity
is possible even under DC voltage because of both elongation of microbubbles present in a liquid
and diffusion of charge carriers from the surface of a bubble into a liquid.
Библиографическая ссылка:
Kupershtokh A.L.
, Pyrgioti E.C.
, Charalambakos V.P.
, Agoris D.P.
, Karpov D.I.
, Medvedev D.A.
, Stamatelatos C.P.
Stochastic models of partial discharge activity in solid and liquid dielectrics
IET Science, Measurement and Technology. 2007. V.1. N6. P.303-311. DOI: 10.1049/iet-smt:20060104 WOS Scopus РИНЦ OpenAlex
Stochastic models of partial discharge activity in solid and liquid dielectrics
IET Science, Measurement and Technology. 2007. V.1. N6. P.303-311. DOI: 10.1049/iet-smt:20060104 WOS Scopus РИНЦ OpenAlex
Идентификаторы БД:
Web of science: | WOS:000251269800001 |
Scopus: | 2-s2.0-34548210861 |
РИНЦ: | 13560742 |
OpenAlex: | W2051118601 |